(0x01,0x05) Built In Test

Run the device Built-In Test (BIT). More...

Classes
struct	mip::C::mip_base_built_in_test_response

Typedefs
typedef struct mip_base_built_in_test_command	mip::C::mip_base_built_in_test_command
	No parameters (empty struct not allowed in C) More...
typedef struct mip_base_built_in_test_response	mip::C::mip_base_built_in_test_response

Functions
void	mip::C::insert_mip_base_built_in_test_response (microstrain_serializer *serializer, const mip_base_built_in_test_response *self)
void	mip::C::extract_mip_base_built_in_test_response (microstrain_serializer *serializer, mip_base_built_in_test_response *self)
mip_cmd_result	mip::C::mip_base_built_in_test (mip_interface *device, uint32_t *result_out)

Detailed Description

Run the device Built-In Test (BIT).

The Built-In Test command always returns a 32 bit value. A value of 0 means that all tests passed. A non-zero value indicates that not all tests passed. Reference the device user manual to decode the result.

Typedef Documentation

mip_base_built_in_test_command

typedef struct mip_base_built_in_test_command mip::C::mip_base_built_in_test_command

No parameters (empty struct not allowed in C)

mip_base_built_in_test_response

typedef struct mip_base_built_in_test_response mip::C::mip_base_built_in_test_response

Function Documentation

extract_mip_base_built_in_test_response()

void mip::C::extract_mip_base_built_in_test_response	(	microstrain_serializer *	serializer,
		mip_base_built_in_test_response *	self
	)

insert_mip_base_built_in_test_response()

void mip::C::insert_mip_base_built_in_test_response	(	microstrain_serializer *	serializer,
		const mip_base_built_in_test_response *	self
	)

mip_base_built_in_test()

mip_cmd_result mip::C::mip_base_built_in_test	(	mip_interface *	device,
		uint32_t *	result_out
	)