(0x01,0x05) Built In Test

Run the device Built-In Test (BIT). More...

Classes
struct	mip::commands_base::BuiltInTest

Functions
TypedResult< BuiltInTest >	mip::commands_base::builtInTest (C::mip_interface &device, uint32_t *resultOut)

Detailed Description

Run the device Built-In Test (BIT).

The Built-In Test command always returns a 32 bit value. A value of 0 means that all tests passed. A non-zero value indicates that not all tests passed. Reference the device user manual to decode the result.

Function Documentation

builtInTest()

TypedResult< BuiltInTest > mip::commands_base::builtInTest	(	C::mip_interface &	device,
		uint32_t *	resultOut
	)