(0xA0,0x01) Built In Test

Contains the continuous built-in-test (BIT) results. More...

Classes
struct	mip::C::mip_system_built_in_test_data

Typedefs
typedef struct mip_system_built_in_test_data	mip::C::mip_system_built_in_test_data

Functions
void	mip::C::insert_mip_system_built_in_test_data (microstrain_serializer *serializer, const mip_system_built_in_test_data *self)
void	mip::C::extract_mip_system_built_in_test_data (microstrain_serializer *serializer, mip_system_built_in_test_data *self)
bool	mip::C::extract_mip_system_built_in_test_data_from_field (const mip_field_view *field, void *ptr)

Detailed Description

Contains the continuous built-in-test (BIT) results.

Due to the large size of this field, it is recommended to stream it at a low rate or poll it on demand.

These bits are "sticky" until the next output message. If a fault occurs in between scheduled messages or while the device is idle, the next packet with this field will have the corresponding flags set. The flag is then cleared unless the fault persists.

Unlike the commanded BIT, some bits may be 1 in certain non-fault situations, so simply checking if the result is all 0s is not very useful. For example, on devices with a built-in GNSS receiver, a "solution fault" bit may be set before the receiver has obtained a position fix. Consult the device manual to determine which bits are of interest for your application.

All unspecified bits are reserved for future use and must be ignored.

Typedef Documentation

mip_system_built_in_test_data

typedef struct mip_system_built_in_test_data mip::C::mip_system_built_in_test_data

Function Documentation

extract_mip_system_built_in_test_data()

void mip::C::extract_mip_system_built_in_test_data	(	microstrain_serializer *	serializer,
		mip_system_built_in_test_data *	self
	)

extract_mip_system_built_in_test_data_from_field()

bool mip::C::extract_mip_system_built_in_test_data_from_field	(	const mip_field_view *	field,
		void *	ptr
	)

insert_mip_system_built_in_test_data()

void mip::C::insert_mip_system_built_in_test_data	(	microstrain_serializer *	serializer,
		const mip_system_built_in_test_data *	self
	)