#include <data_system.hpp>
◆ asTuple() [1/2]
auto mip::data_system::BuiltInTest::asTuple |
( |
| ) |
|
|
inline |
◆ asTuple() [2/2]
auto mip::data_system::BuiltInTest::asTuple |
( |
| ) |
const |
|
inline |
◆ extract()
void mip::data_system::BuiltInTest::extract |
( |
Serializer & |
serializer | ) |
|
◆ insert()
void mip::data_system::BuiltInTest::insert |
( |
Serializer & |
serializer | ) |
const |
◆ DESCRIPTOR
◆ DESCRIPTOR_SET
constexpr const uint8_t mip::data_system::BuiltInTest::DESCRIPTOR_SET = ::mip::data_system::DESCRIPTOR_SET |
|
staticconstexpr |
◆ DOC_NAME
constexpr const char* mip::data_system::BuiltInTest::DOC_NAME = "BuiltInTest" |
|
staticconstexpr |
◆ FIELD_DESCRIPTOR
◆ HAS_FUNCTION_SELECTOR
constexpr const bool mip::data_system::BuiltInTest::HAS_FUNCTION_SELECTOR = false |
|
staticconstexpr |
◆ NAME
constexpr const char* mip::data_system::BuiltInTest::NAME = "BuiltInTest" |
|
staticconstexpr |
◆ result
uint8_t mip::data_system::BuiltInTest::result[16] = {0} |
Parameters.
Device-specific bitfield (128 bits). See device user manual. Bits are least-significant-byte first. For example, bit 0 is located at bit 0 of result[0], bit 1 is located at bit 1 of result[0], bit 8 is located at bit 0 of result[1], and bit 127 is located at bit 7 of result[15].
The documentation for this struct was generated from the following files: