MIP SDK
0.0.1
MicroStrain Communications Library for embedded systems
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Classes | |
struct | mip::C::mip_system_built_in_test_data |
Typedefs | |
typedef struct mip_system_built_in_test_data | mip::C::mip_system_built_in_test_data |
Functions | |
void | mip::C::insert_mip_system_built_in_test_data (mip_serializer *serializer, const mip_system_built_in_test_data *self) |
void | mip::C::extract_mip_system_built_in_test_data (mip_serializer *serializer, mip_system_built_in_test_data *self) |
bool | mip::C::extract_mip_system_built_in_test_data_from_field (const struct mip_field *field, void *ptr) |
Contains the continuous built-in-test (BIT) results.
Due to the large size of this field, it is recommended to stream it at a low rate or poll it on demand.
These bits are "sticky" until the next output message. If a fault occurs in between scheduled messages or while the device is idle, the next packet with this field will have the corresponding flags set. The flag is then cleared unless the fault persists.
Unlike the commanded BIT, some bits may be 1 in certain non-fault situations, so simply checking if the result is all 0s is not very useful. For example, on devices with a built-in GNSS receiver, a "solution fault" bit may be set before the receiver has obtained a position fix. Consult the device manual to determine which bits are of interest for your application.
All unspecified bits are reserved for future use and must be ignored.
void mip::C::extract_mip_system_built_in_test_data | ( | mip_serializer * | serializer, |
mip_system_built_in_test_data * | self | ||
) |
bool mip::C::extract_mip_system_built_in_test_data_from_field | ( | const struct mip_field * | field, |
void * | ptr | ||
) |
void mip::C::insert_mip_system_built_in_test_data | ( | mip_serializer * | serializer, |
const mip_system_built_in_test_data * | self | ||
) |