Collaboration diagram for (0x01,0x05) Built In Test [CPP]:

Classes
struct	mip::commands_base::BuiltInTest

Functions
void	mip::commands_base::insert (Serializer &serializer, const BuiltInTest &self)

void	mip::commands_base::extract (Serializer &serializer, BuiltInTest &self)

void	mip::commands_base::insert (Serializer &serializer, const BuiltInTest::Response &self)

void	mip::commands_base::extract (Serializer &serializer, BuiltInTest::Response &self)

CmdResult	mip::commands_base::builtInTest (C::mip_interface &device, uint32_t *resultOut)

Detailed Description

Run the device Built-In Test (BIT).

The Built-In Test command always returns a 32 bit value. A value of 0 means that all tests passed. A non-zero value indicates that not all tests passed. Reference the device user manual to decode the result.

Function Documentation

◆ builtInTest()

CmdResult mip::commands_base::builtInTest	(	C::mip_interface &	device,
		uint32_t *	resultOut
	)

◆ extract() [1/2]

void mip::commands_base::extract	(	Serializer &	serializer,
		BuiltInTest &	self
	)

◆ extract() [2/2]

void mip::commands_base::extract	(	Serializer &	serializer,
		BuiltInTest::Response &	self
	)

◆ insert() [1/2]

void mip::commands_base::insert	(	Serializer &	serializer,
		const BuiltInTest &	self
	)

◆ insert() [2/2]

void mip::commands_base::insert	(	Serializer &	serializer,
		const BuiltInTest::Response &	self
	)

Classes