mip::data_system::BuiltInTest Struct Reference

#include <data_system.hpp>

Public Attributes
uint8_t	result [16] = {0}
	Device-specific bitfield (128 bits). See device user manual. Bits are least-significant-byte first. For example, bit 0 is located at bit 0 of result[0], bit 1 is located at bit 1 of result[0], bit 8 is located at bit 0 of result[1], and bit 127 is located at bit 7 of result[15]. More...

Static Public Attributes
static const uint8_t	DESCRIPTOR_SET = ::mip::data_system::DESCRIPTOR_SET
static const uint8_t	FIELD_DESCRIPTOR = ::mip::data_system::DATA_BUILT_IN_TEST
static const bool	HAS_FUNCTION_SELECTOR = false

Member Data Documentation

DESCRIPTOR_SET

const uint8_t mip::data_system::BuiltInTest::DESCRIPTOR_SET = ::mip::data_system::DESCRIPTOR_SET

static

FIELD_DESCRIPTOR

const uint8_t mip::data_system::BuiltInTest::FIELD_DESCRIPTOR = ::mip::data_system::DATA_BUILT_IN_TEST

static

HAS_FUNCTION_SELECTOR

const bool mip::data_system::BuiltInTest::HAS_FUNCTION_SELECTOR = false

static

result

uint8_t mip::data_system::BuiltInTest::result[16] = {0}

Device-specific bitfield (128 bits). See device user manual. Bits are least-significant-byte first. For example, bit 0 is located at bit 0 of result[0], bit 1 is located at bit 1 of result[0], bit 8 is located at bit 0 of result[1], and bit 127 is located at bit 7 of result[15].

---

The documentation for this struct was generated from the following file:

• src/mip/definitions/data_system.hpp